Anomalous X-Ray Diffraction Line Shift in Heterogeneous Langmuir-Blodgett Multilayer Films
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概要
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The X-ray diffraction pattern of Langmuir-Blodgett films formed with alternatelydeposited Cd stearate and Cd behenate exhibits anomalous shifts in the diffractionangles when they have the deposition order with dimerized Cd layers. The magnitudeof the reciprocal vector of the n-th order is represented by G.= nG. - ( - 1)'y., whereG. is for averaged unit vector and g. is the shift that changes gradually with the indexof diffraction and the multiplicity of the layers.Langmuir-Blodgett multilayer, superlattice, X-ray diffraction
- 社団法人日本物理学会の論文
- 1991-06-15
著者
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NOGAMI Yoshio
Department of Physics, Okayama University
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Nogami Yoshio
Department Of Physics Kyoto University
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ISHIGURO Takehiko
Department of Physics,Kyoto University
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HAMANAKA Hiroshi
Department of Physics,Kyoto University
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Ishiguro Takehiko
Department Of Physics Kyoto University
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Ishiguro Takehiko
Department Of Electronics Faculty Of Engineering Kyoto University
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Hamanaka Hiroshi
Department Of Physics Kyoto University
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Nogami Yoshio
Department Of Physics Graduate School Of Natural Science And Technology Okayama University
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