Study of the Surface Plasmon in a Thin Copper Film by an Electron Energy Analyser with High Resolution
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概要
- 論文の詳細を見る
An energy loss peak at 2 eV in the spectrum of electrons transmitted through thin copper films is studied by using energy analyser with high resolution of 50 meV. The observed energy loss spectra are in good agreement with calculated ones. From a theoretical consideration, it is concluded that the 2 eV peak is caused from the excitations of surface plasmon strongly affected by surface oxide layers.
- 社団法人日本物理学会の論文
- 1976-05-15
著者
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Takigawa Tadahiro
College Of General Education University Of Tokyo
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Fujimoto Fuminori
College Of General Education University Of Tokyo
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FUJIMOTO Fuminori
College of Arts and Sciences, University of Tokyo:(Present address)Institute of Scientific and Industrial Research, Osaka University
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