Characterization of Soft X-Rays Generated in Gas-Puffed Z-Pinch
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概要
- 論文の詳細を見る
Soft X-rays generated with a gas-puff pinch device is characterized using a pinhole camera which enables a quantitative intensity measurement, a Bragg imaging spectrometer and an X-ray diode. A neutral argon shell whose line density was 8.1×10^<17> atoms/cm (M=5.5×10^<-5> g/cm) was formed between the electrodes. The soft X-rays were emitted for about 10 ns in the early stage of the plasma column formation. Highly localized and intense soft X-ray sources, so-called hot spots, were observed in the pinched plasma. The emitted energy was estimated to be 50±15 J into 4π sr, for Ar K-lines . The reproducibility of the X-ray emission are discussed.
- 社団法人日本物理学会の論文
- 1995-11-15
著者
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Hirano Katsumi
Department of Electronic Engineering, Gunma University
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SHIMODA Katsuji
Department of Electronic Engineering Gunma University
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Hirano Katsumi
Department Of Electronic Engineering Gunma University
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Shimoda K
Department Of Electronic Engineering Gunma University
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Du J
Northeast China Inst. Electric Power Engineering
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Du Jian
Department of Electronic Engineering, Gunma University
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Ohata Tetsuya
Department of Electronic Engineering, Gunma University
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Ohata Tetsuya
Department Of Electronic Engineering Gunma University
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