Characterization of Soft X-Ray Radiation from Plasma Focus Device with Gas Puff

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Characterization of soft X-ray enaission frona a plasma foctrs device with Ar gas pttff is carriedout. Intensities of the A-shell lines are observed quantitatively and spectroscopically in a singleshot. Depending on the delay time between the ptrffing of the Ar and the main discharge,the generated soft X-ray source in the pinched pl;tsma is divided into two categories, namelyfilarnentary or scattered spot sottrces. The soft X-ray intensity of the filamentary source ismuch higher than that of tlue scattered spot sotrrces. It is observed that the absorption by thesurrounding plasnaa is renaarkable. Using an izauaging Bragg spectrometer, spatial distribtrtionsof soft X-ray irauages depicted by the H-like Lya line, the He-like resonance line, the He-likeintercornbination line and the Li-like dielectronic satellite lines of Ar tons are obtained. It isrecognized that the itnage from Lycx, the other lines and trnresolved pinhole inuage foruaa a nestwith a cornmon center. Althotrgh the He-like resonance line is especially sttb.ject to remarkableabsorption, we restored the observed intensity and evalttate the spatial distribtrtion of the electrontemperature and the electron density.
1998-02-15