Complete Scaling Analysis of the Metal-Insulator Transition in Ge:Ga: Effects of Doping-Compensation and Magnetic Field(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
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概要
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We report on the complete scaling analysis of low temperature electron transport properties with and without magnetic field in the critical regime for the metal-insulator transition in two series of homogeneously doped p-type Ge samples: i) nominally uncompensated neutron-transmutation-doped (NTD) ^<70>Ge:Ga samples with the technological compensation ratio K < 0.001, and ii) intentionally compensated NTD ^<nat>Ge:Ga,As samples with K = 0.32. For the case of the uncompensated series in zero magnetic field, the critical exponents μ, ν, and ζ determined for the electrical conductivity (σ), localization length (ξ), and impurity dielectric susceptability (X_<imp>), respectively, change at the very vicinity of the critical Ga concentration (N 〜 N_c). Namely, the anomalous critical exponents, e.g. μ ≈ 0.5, change to μ ≈ 1 only within the region 0.99N_C < N < 1.01N_C. On the other hand, the same critical behavior, μ ≈ 1, was found for the K - 0.32 series in much larger region 0.25N_C < N < 2.4N_C. This finding suggests that the μ ≈ 1 critical behavior observed for the nominally uncompensated series in the extremely narrow region is due to the presence of the self-compensation of acceptors by native defects and/or technologically unavoidable very small amount of doping compensation (K < 0.001). Therefore, the width of the concentration that can be fitted with μ ≈ 1 around N_c is likely to scale with the degree of compensation (K), and disappears in the limit K → 0 i.e., only the region with the anomalous exponent μ ≈ 0.5 remains for the case of K = 0. An externally applied magnetic field to nominally uncompensated samples also broadens the width of μ ≈ 1 around N_c, but with a mechanism clearly different from that of compensation. The unified description of our experimental results unambiguously establishes the values of the critical exponents μ, ν, and ζ for doped semiconductors with and without compensation and magnetic field.
- 社団法人日本物理学会の論文
- 2004-01-15
著者
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渡辺 雅之
京大院人間・環境
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OHTSUKI Tomi
Department of Physics,Sophia University
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ITOH Kohei
Department of Applied Physics and Physico-Informatics, Keio University
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Haller E
Uc Berkeley And Lawrence Berkeley National Laboratory
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Ohtsuki T
Sophia Univ. Tokyo
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Itoh K
Department Of Applied Physics And Physico-informatics Keio University
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Itoh Kohei
Department Of Applied Physics And Physico-informatics And Crest-jst Keio University
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Ootuka Youiti
Tsukuba Research Center For Interdisciplinary Materials Science And Institute Of Physics University
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Watanabe M
Macroscopic Quantum Coherence Laboratory Frs Riken
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Watanabe M
Institute For Solid State Physics University Of Tokyo:(present)institute Of Materials Structure Scie
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WATANABE Michio
Macroscopic Quantum Coherence Laboratory, FRS, RIKEN
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HALLER Eugene
UC Berkeley and Lawrence Berkeley National Laboratory
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Ohtsuki T
Yokohama City Univ. Yokohama
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Ohtsuki T
Department Of Physics Sophia University
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Ohtsuki Tomi
Department Of Physics Faculty Of Science University Of Tokyo
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Watanabe Michio
Macroscopic Quantum Coherence Laboratory Frs Riken
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Itoh Kohei
Department of Applied Physics and CREST-JST, Keio University, Yokohama 223-8522, Japan
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