Instability of Rotating Electron Sheath in Crossed Field Device
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概要
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Instability of the rotating electron sheath in the crossed feld device is described. Above the critical magnetic field, the rotating sheath is bunched and the E×B rotational oscillations at about 10Mc are excited. These phenomena are related to the associated low frequency oscillations. From the results it is reasonably concluded that the bunching of the electron sheath is in close connection with the increase in ion loss which results from the collision between ions and neutrals. It is found that the critical magnetic field reasonably agrees with the cutoff field of ions, and diocotron effect is ruled out at the gas pressure above 10^<-3> Torr.
- 社団法人日本物理学会の論文
- 1965-07-05
著者
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Wasa Kiyotaka
Research Institute Of Innovative Technology For The Earth
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Hayakawa Shigeru
Research Laboratory Wireless Division Matsushita Electric Industrial Co. Ltd.
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Wasa Kiyotaka
Research Laboratory Wireless Division Matsushita Electric Iudustrial Co. Ltd.
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Hayakawa Shigeru
Research Laboratory Wireless Division Matsushita Electric Iudustrial Co. Ltd.
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