Self Synchronous Circuits for Robust Operation in Low Voltage and Soft Error Prone Environments

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概要

• 論文の詳細を見る
• 2013-04-01

著者

• Asada Kunihiro

  The Department Of Electrical Engineering And Information Systems The University Of Tokyo

• Devlin Benjamin

  The Dept. Of Electrical Engineering And Information Systems University Of Tokyo

• IKEDA Makoto

  the Department of Electrical Engineering and Information Systems, The University of Tokyo

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• All-Digital PMOS and NMOS Process Variability Monitor Utilizing Shared Buffer Ring and Ring Oscillator
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• Self Synchronous Circuits for Robust Operation in Low Voltage and Soft Error Prone Environments

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