Low-temperature Heteroepitaxy of Morphology-controlled ZnO Mirco/Nanorod Arrays on GaN Substrates
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概要
- 論文の詳細を見る
- 2010-03-05
著者
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LIN Ching-Fuh
Graduate Institute of Electro-Optical Engineering, Graduate Institute of Electronics Engineering and
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Lin Ching-fuh
Graduate Institute Of Electro-optical Engineering Graduate Institute Of Electronics Engineering And
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Lin Wen-han
Graduate Institute Of Photonics And Optoelectronics National Taiwan University
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Chen Chang-ho
Mirco Optical-mechanical-electronic Business Development Group Walsin Lihwa Corp.
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CHAO Cha-Hsin
Graduate Institute of Photonics and Optoelectronics, National Taiwan University
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CHANGJEAN Ching-Hua
Mirco Optical-Mechanical-Electronic Business Development Group, Walsin Lihwa Corp.
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PAN Chang-Chi
Mirco Optical-Mechanical-Electronic Business Development Group, Walsin Lihwa Corp.
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Lin Ching-fuh
Graduate Institute Of Photonics And Optoelectronics National Taiwan University
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Chao Cha-hsin
Graduate Institute Of Photonics And Optoelectronics National Taiwan University
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Pan Chang-chi
Mirco Optical-mechanical-electronic Business Development Group Walsin Lihwa Corp.
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Changjean Ching-hua
Mirco Optical-mechanical-electronic Business Development Group Walsin Lihwa Corp.
関連論文
- Influence of Separate Confinement Heterostructure Layer on Carrier Distribution in InGaAsP Laser Diodes with Nonidentical Multiple Quantum Wells
- Broad-Gain Measurement of Semiconductor Optical Amplifier with Nonidentical Multiple Quantum Wells
- Low-temperature Heteroepitaxy of Morphology-controlled ZnO Mirco/Nanorod Arrays on GaN Substrates
- Broad-Gain Measurement of Semiconductor Optical Amplifier with Nonidentical Multiple Quantum Wells
- Significance of Surface Properties of CdS Nanoparticles
- Electron-Determined Nonuniform Carrier Distribution among InGaAsP Multiple Quantum Wells
- Influence of Separate Confinement Heterostructure Layer on Carrier Distribution in InGaAsP Laser Diodes with Nonidentical Multiple Quantum Wells