Reduction of Charge Injection and Current-Mismatch Errors of Charge Pump for Phase-Locked Loop
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概要
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This paper proposes a new charge pump to suppress spurious noise of phase-locked loops. The spurious noise is induced by charge injection generated from the parasitic capacitors associated with switches and the current-mismatch between the charging and discharging currents of the charge pump. A new charge pump is configured by adding an operational amplifier, a sample-and-hold circuit, and switches to a basic charge pump. During the idling time of the charge pump, the currents of the current sources are adjusted and the current-mismatch are reduced to 0.3%. Applying the proposed charge pump to a phase-locked loop, we can suppress the spurious noise by 18dB compared with a PLL using a basic one.
- 2009-02-01
著者
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Fujii Nobuo
Graduate School Of Science And Engineering Tokyo Institute Of Technology
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YOSHIOKA Masahiro
Graduate School of Science and Engineering, Tokyo Institute of Technology
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Yoshioka Masahiro
Graduate School Of Science And Engineering Tokyo Institute Of Technology
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