Long-Term Reliability of the Blocking Capability and Failure Voltage of Electrostatic Discharge(ESD) of SOI High-Voltage Device and IC

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1997-09-16

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Long-Term Reliability of the Blocking Capability and Failure Voltage of Electrostatic Discharge of the SOI High-Voltage Device and IC
Long-Term Reliability of the Blocking Capability and Failure Voltage of Electrostatic Discharge(ESD) of SOI High-Voltage Device and IC
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