Hirabayashi Atsuo | Fuji Electric Co. Ltd.
スポンサーリンク
概要
関連著者
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Sumida Hitoshi
Fuji Electric Co. Ltd.
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Sumida H
Fuji Electric Co. Ltd. Nagano Jpn
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Sumida Hitoshi
Advanced Device Technology Laboratory Fuji Electric Corporate Research & Development Ltd.
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Hirabayashi Atsuo
Fuji Electric Co. Ltd.
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Hirabayashi Atsuo
Advanced Device Technology Laboratory Fuji Electric Corporate R Amp Ltd.
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HIRABAYASHI Atsuo
Fuji Electric Co., Ltd.
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SHIMABUKURO Hiroshi
Fuji Electric Co., Ltd.
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HIRABAYASHI Atsuo
Advanced Device Technology Laboratory, Fuji Electric Corporate Research & Development Ltd.
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Sumida Hitoshi
Advanced Device Technology Laboratory Fuji Electric Corporate R Amp Ltd.
著作論文
- Long-Term Reliability of the Blocking Capability and Failure Voltage of Electrostatic Discharge of the SOI High-Voltage Device and IC
- Long-Term Reliability of the Blocking Capability and Failure Voltage of Electrostatic Discharge(ESD) of SOI High-Voltage Device and IC
- Lateral IGBT Structure on the SOI Film with the Collector-Short Region for Improved Blocking Capability