Reference sample for the evaluation of SEM image resolution at a high magnification-nanometer-scale Au particles on an HOPG substrate
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概要
- 論文の詳細を見る
- 2005-08-01
著者
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MATSUHATA Hirofumi
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology
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HARAICHI Satoshi
Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology
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Matsuhata Hirofumi
Nanoelectronics Research Institute Aist
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Matsuhata Hirofumi
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Okayama Shigeo
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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Haraichi Satoshi
Nanoelectronics Research Institute National Institute Of Advanced Industrial Science And Technology
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