Measurements of Minute Lattice Distortions in Silicon Crystals by X-Ray Double-Crystal Topography Using Extremely Asymmetric Reflection
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-12-15
著者
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Futagami Koji
Department of Electronics, Miyazaki University
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Futagami Koji
Department Of Electrical Engineering Faculty Of Engineering Kyushu Sangyo University
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FUKUMORI Taichiro
Department of Materials Science, Faculty of Engineering, Miyazaki University
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KUROKI Kiyohiro
Graduate Course in Materials Science, Graduate School of Engineering, Miyazaki University
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