Scanning Tunneling Microscopy Barrier Height Imaging of Subsurface Dopant Atoms on Hydrogen-Terminated Si(111)
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概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-07-30
著者
-
Sakai A
International Innovation Center Kyoto University
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Kobayashi Kengo
Department Of Internal Medicine Asahi Rosai Hospital
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KUROKAWA Shu
International Innovation Center, Kyoto University
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SAKAI Akira
International Innovation Center, Kyoto University
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- Scanning Tunneling Microscopy Barrier Height Imaging of Subsurface Dopant Atoms on Hydrogen-Terminated Si(111)