Etching Characteristics of Manganese-Doped Zinc Sulfide Film Using Cl_2/CF_4 Inductively Coupled Plasma
スポンサーリンク
概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2004-05-15
著者
-
KWON Kwang-Ho
Department of Electronic Engineering, Hanseo Unviersity
-
Lee Yong-eui
Electronics And Telecommunications Research Institute
-
YUN Sun
Electronics and Telecommunications Research Institute
-
KIM Chang-Il
School of Electrical & Electronic Engineering, Chung-Ang University
関連論文
- Recovery of Silicon Surface after Reactive Ion Etching of SiO_2 using CHF_3/C_2F_6 Plasma
- Size effect of substitutional alkaline-earth elements on the electrical and structural properties of LaMnO3 films
- Etching Characteristics of Manganese-Doped Zinc Sulfide Film Using Cl_2/CF_4 Inductively Coupled Plasma
- Energy Level Structure of Amorphous Silicon Carbide
- Infrared-Cut Filter : Optics and Quantum Electronics
- Etch characterization of TiO2 thin films using metal-insulator-metal capacitor in adaptively coupled plasma (Special issue: Dry process)
- Etch properties of TiN thin film in metal-insulator-metal capacitor using inductively coupled plasma (Special issue: Dry process)
- Etch Characteristics of ZrO2 Thin Films in High Density Plasma
- Etching Characteristics of Manganese-Doped Zinc Sulfide Film Using Cl2/CF4 Inductively Coupled Plasma