スポンサーリンク
Toray Research Center Inc. | 論文
- P27: Technique for Measuring Elastic Modulus of Organic Thin Film with Modified Three-point Bending Test using Composite Beam(SHORT ORAL PRESENTATION FOR POSTERS II)
- Current Induced Grain Growth of Electroplated Copper Film (Special Issue : Advanced Metallization for ULSI Applications)
- Complete NMR assignment of a sulfonated aromatic block copolymer via heteronuclear single-quantum correlation, heteronuclear multiple-bond correlation and heteronuclear single-quantum correlation total correlation spectroscopy (Special Issue : NMR of Poly
- Viscoelastic Behavior of Scarcely Crosslinked Poly(dimethyl siloxane) Gels : 2. Effects of Sol Component and Network Strand Length
- Viscoelastic Behavior of Scarcely Crosslinked Poly(dimethyl siloxane) Gel
- Three-Dimensional Elemental Analysis of Commercial 45nm Node Device with High-k/Metal Gate Stack by Atom Probe Tomography
- Thermoanalytical Behavior of Moisture in Aromatic Polyamide and Polyimide Films
- The systematic study of the microstructure of crosslinked copolymers from siloxane macromonomers and methacrylates by changes in composition and components
- Stress Characterization of Si by a Scanning Near-Field Optical Raman Microscope with Spatial Resolution and with Penetration Depth at the Nanometer Level, using Resonant Raman Scattering
- Microscopic Degradation Mechanisms in Silicon Photovoltaic Module under Long-Term Environmental Exposure
- Complete NMR assignment of a sulfonated aromatic block copolymer via heteronuclear single-quantum correlation, heteronuclear multiple-bond correlation and heteronuclear single-quantum correlation total correlation spectroscopy
- Structural Changes of Y2O3 and La2O3 Films by Heat Treatment
- Study of Peeling at Doped NiSi/SiO2 Interface
- Measurement of Interaction Forces between Galactose-Coated Particle and Hepatocyte from Mouse Using Atomic Force Microscopy
- Twenty-Five Millisecond Resolution Time-Resolved X-Ray Absorption Spectroscopy in Dispersive Mode
- Structural Studies of High-Performance Low-$k$ Dielectric Materials Improved by Electron-Beam Curing
- Three-Dimensional Dopant Characterization of Actual Metal--Oxide--Semiconductor Devices of 65 nm Node by Atom Probe Tomography
- Three-Dimensional Spatial Distributions of Pt Catalyst Nanoparticles on Carbon Substrates in Polymer Electrolyte Fuel Cells
- Three-Dimensional Dopant Characterization of Actual Metal-Oxide-Semiconductor Devices of 65 nm Node by Atom Probe Tomography
- Surface-Enhanced Raman Scattering from Surface Layers of Gas-Evaporated Silver Small Particles