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Thin Film Materials Research Center, Korea Institute of Science and Technology | 論文
- A single element phase change memory (Silicon devices and materials)
- A single element phase change memory (Electron devices)
- A Single Element Phase Change Memory(Session 8A : Memory 2)
- A Single Element Phase Change Memory(Session 8A : Memory 2)
- Reduction of the threshold voltage fluctuation in an electrical phase change memory device with a Ge_1Sb_2Te_4 / TiN cell structure
- Lower Voltage Operation of a Phase Change Memory Device with a Highly Resistive TiON Layer
- Analysis of Read-out Signals in Land/Groove Recording of a Phase-Change Optical Disc
- Determination of Otical Constants of Thin Films from Measurements of Reflectance and Transmittance
- 24-P-05 Effect of Thermal Strain on the Quality Factor of Microwave MgTiO_3 Ceramics
- Temperature Dependences of Piezoelectric and Linear Electrooptic Properties of Rhombohedral 0.67Pb(Mg_Nb_)O_3-0.33PbTiO_3 Single Crystal Oriented in Direction
- Analysis of stress distribution in flexible piezoelectric energy harvester
- DC Bias Effects on Piezoelectric Constants of Rhombohedral Pb(Zn1/3Nb2/3)O3–PbTiO3 Single Crystals
- A Single Element Phase Change Memory