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Semiconductor Technology Academic Research Center (starc) | 論文
- 0.45-V Input Higher Than 90% Efficiency Buck Converter with On-Chip Gate Boost (シリコン材料・デバイス)
- 0.45-V Input Higher Than 90% Efficiency Buck Converter with On-Chip Gate Boost (集積回路)
- A 40-nm 0.5-V 12.9-pJ/Access 8T SRAM Using Low-Energy Disturb Mitigation Scheme
- Two-Tone Signal Generation for ADC Testing
- 0.45-V Input Higher Than 90% Efficiency Buck Converter with On-Chip Gate Boost
- 0.45-V Input Higher Than 90% Efficiency Buck Converter with On-Chip Gate Boost
- Estimation of Delay Test Quality and Its Application to Test Generation
- 0.45-V Input Higher Than 90% Efficiency Buck Converter with On-Chip Gate Boost
- 0.45-V Input Higher Than 90% Efficiency Buck Converter with On-Chip Gate Boost