Two-Tone Signal Generation for ADC Testing
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概要
- 論文の詳細を見る
This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for such as communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.
著者
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Yamada Takafumi
Division Of Cardiovascular Surgery Oita Prefectural Hospital
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Niitsu Kiichi
Department Of Electronic Engineering Graduate School Of Engineering Gunma University
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KOBAYASHI Haruo
Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
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KATO Keisuke
Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
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WAKABAYASHI Kazuyuki
Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
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ABE Fumitaka
Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
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GAO Chuan
Division of Electronics and Informatics, Faculty of Science and Technology, Gunma University
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KOBAYASHI Osamu
Semiconductor Technology Academic Research Center (STARC)
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KATO Keisuke
Division of Electronics and Informatics Faculty of Science and Technology, Gunma University
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- Two-Tone Signal Generation for ADC Testing