Estimation of Delay Test Quality and Its Application to Test Generation
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概要
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As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults. In order to derive better test quality by SDQM, the following two things are important: for each transition fault, (1) to find out the accurate length of the longest sensitizable paths along which the fault is activated and propagated, and (2) to generate a test pattern that detects the fault through as long paths as possible. In this paper, we propose a method to calculate the length of the potentially sensitizable longest path for detection of a transition fault. In addition, we develop a procedure to extract path information that helps high quality transition ATPG. Experimental results show that the proposed method improves SDQL (Statistical Delay Quality Level) by not only accurate calculation of the longest sensitizable paths but also detection of faults through longer paths.
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著者
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WEN Xiaoqing
Kyushu Institute of Technology
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HATAYAMA Kazumi
Semiconductor & Integrated Circuits,Hitachi Ltd
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AIKYO Takashi
Semiconductor Technology Academic Research Center (STARC)
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Kajihara Seiji
Kyushu Inst. Technol. Iizuka‐shi Jpn
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Morishima Shohei
Kyushu Institute of Technology
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Yamamoto Masahiro
Kyushu Institute of Technology
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Fukunaga Masayasu
Semiconductor Technology Academic Research Center
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Aikyo Takashi
Semiconductor Technology Academic Research Center
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