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Research Institute Of Electronics Shizuoka University | 論文
- Design of dopant-induced quantum dot arrays in silicon nanostructures for single-electron transfer (電子デバイス)
- Single-electron transfer in phosphorous-doped Si nanowire FETs
- Time-controlled single-electron transfer in single-gated asymmetric multiple tunnel junction arrays
- Tunneling current oscillations in Si/SiO_2/Si structures(結晶成長評価及びデバイス(化合物,Si,SiGe,その他の電子材料))
- Tunneling current oscillations in Si/SiO_2/Si structures(結晶成長評価及びデバイス(化合物,Si, SiGe,その他の電子材料))
- Fowler-Nordheim Current Oscillations in Si(111)/SiO_2/Twisted-Si(111) Tunneling Structures
- Current fluctuation in single-hole transport through a two-dimensional Si multidot
- Formation of Nanometer-Scale Dislocation Network Sandwiched by Silicon-on-Insulator Layers
- Charge polarization effect on single-hole-characteristics in a two-dimensional Si multidot structure
- Photoinduced Effects on Single-Charge Tunneling in a Si Two-Dimensional Multidot Field-Effect Transistor
- Ambipolar Coulomb Blockade Characteristics in a Two-Dimensional Si Multidot Device
- Resonant tunneling characteristics in SiO₂/Si double-barrier structures in a wide range of applied voltage
- Effects of Vegetable Containing Gamma-Aminobutyric Acid on the Cardiac Autonomic Nervous System in Healthy Young People
- Effect of UV/Ozone Treatment on Nanogap Electrodes for Molecular Devices
- Effect of UV/ozone Treatment of Nanogap Electrodes for Molecular Devices
- Seebeck Coefficient of Ultrathin Silicon-on-Insulator Layers
- Si/SiO_2共鳴トンネル構造におけるSi井戸層のドット化効果(結晶成長評価及びデバイス(化合物,Si,SiGe,その他の電子材料))
- Si/SiO_2共鳴トンネル構造におけるSi井戸層のドット化効果(結晶成長評価及びデバイス(化合物,Si,SiGe,その他の電子材料))
- シリコン多重ドット構造における単電子伝導の光応答特性(半導体Si及び関連材料・評価)
- 極薄SOI構造の熱凝集現象とパターニングの効果(結晶成長評価及びデバイス(化合物,Si,SiGe,その他の電子材料))
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