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Physics Department, Tokyo Institute of Technology | 論文
- Energy-filtered Electron Interferometry in Reflection Electron Microscopy
- Direct Current Heating Induced Giant Step Bunching and Wandering on Si(111) and (001) Vicinal Surfaces
- Ultra High Vacuum Reflection Electron Microscopy Study of Step-Dislocation Interaction on Si(111) Surface
- UHV-TEM-REM Studies of Si(111) Surfaces
- A New Technique to Produce Clean and Thin Silicon Films In Situ in a UHV Electron Microscope for TEM-TED Studies of Surfaces
- Biatomic Layer-High Steps on Si(001)2×1 Surface
- Atomic Resolution TEM Images of the Au(001) Reconstructed Surface
- Epitaxy of Au and Ag on Cleaved (10, 0) Surface of MoS_2 : Surfaces, Interfaces and Films
- Magnetic Feature and Morphological Study of X-Ray Bright Points with Hinode
- Some Properties of Complex Oxides AB_B'_O_3 of Perovskite Type
- Diffuse Streak Diffraction Pattern of Electron and X-Rays due to Low Frequency Optical Mode in Tetragonal BaTiO_3
- Streak Pattern from Single Crystals
- Suzaku Observation of the Anomalous X-Ray Pulsar 1E 1841-045
- An Ion-Sputtering Gun to Clean Crystal Surfaces In-Situ in an Ultra-High-Vacuum Electron Microscope
- Electron Beam Evaporator for In Situ Deposition Studies of Refractory Metal Thin Films in UHV Electron Microscope
- Contrast of Closely Spaced Misfit Dislocations
- On the Growth Feature of Sn Deposit on SnTe Substrate
- Structure and Phase Transition of Solid Hydrogen Sulphide
- Atomic Scattering Factor for Electrons of Atoms with Aspherical Charge Distribution
- New Determination of the Temperature of Gold and Silver Points on the Thermodynamic Temperature Scale