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Photon Factory Institute Of Materials Structure Science | 論文
- Dynamic Behaviour of the local Layer Structure of Antiferroelectric Liquid Crystals under a High Electric Field Measured by Time-resolved Synchrotron X-Ray Microbeam Diffraction
- X-Ray Analysis of the Layer Structure in the Chiral Smectic Phase Showing V-shaped Switching
- Structure of Needlelike Defect in Homogeneously Aligned Cells of a Ferroelectric Liquid Crystal Mixture Studied Using X-Ray Microbeam
- Spontaneous Layer Twist in a Stripe Texture of Chiral Ferroelectric Smectics Observed by Synchrotron X-Ray Microdiffraction
- Study on Molecular Dimerization Inducing the Antiferroelectric Liquid Crystalline Phase by Measuring the Smectic Layer Thickness in Various Compounds
- Influence of the Optical Purity on the Smectic Layer Thickness and the Transition Order in Enantiomeric Mixtures of an Antiferroelectric Liquid Crystal
- X-Ray Resonance Exchange Scattering at the Nd L_-Edges in Nd_2Fe_B
- Magnetic XANES of Circularly Polarized X-Ray Absorption on Fe and Ni Metals and Nd_2Fe_B Compound
- X-Ray Resonance Magnetic Scattering
- Grown-in Microdefects in a Slowly Grown Czochralski Silicon Crystal Observed by Synchrotron Radiation Topography
- Mierodefects in an As-Grown Czoehralski Silicon Crystal Studied by Synchrotron Radiation Section Topography with Aid of Computer Simulation
- Observation of Microdefects in As-Grown Czochralski Silicon Crystals by Synchrotron Radiation Topography
- Numerically Simulated and Experimentally Obtained X-Ray Section Topographs of a Spherical Strain Field in a Floating Zone Silicon Crystal
- Enlargement of Poly-Si Film Grain Size by Excimer Laser Annealing and Its Application to High-Performance Poly-Si Thin Film Transistor
- Synchrotron Radiation Section Topography with Extremely High-Order Reflection and Its Application to the Characterization of MCZ-Silicon Crystals
- Measurement and Analysis of the Static Debye-Waller Factor of Cz-Silicon with Small Oxygen Precipitates : Techniques, Instrumentations and Measurement
- Measurement of the Static Debye-Waller Factor of Silicon Crystals by the Pendellosung Fringe Method
- Laser Patterning Method for Integrated Type a-Si Solar Cell Submodules
- Grazing Incidence X-Ray Diffraction Study of Arachidic Acid Monolayer on Cyanine Dye Aqueous Solution
- Determination of the GaAs/AlAs Superlattice Period from the First-Order Superlattice Bragg Reflection