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National Institute For Advanced Industrial Science And Technology | 論文
- Fluorescence-Detected X-Ray Absorption Spectroscopy Applied to Structural Characterization of Very Thin Films;Ion-Beam-Induced Modification of Thin Ni Layers on Si(100)
- Polarized X-Ray Absorption Spectra of Bromine-Doped Polyacetylene;Evidence for Highly-Oriented Polybromine Ions
- Temporal Change of Dissolved Inorganic Carbon in the Subsurface Water at Station KNOT (44°N, 155°E) in the Western North Pacific Subpolar Region
- Strain Effects on Interdiffusion in InAs_P_x/InP Heterostructures
- Operating Conditions to Achieve High Performance in PPCD in a Reversed-Field Pinch Plasma
- High Energy Magnetic Excitations from the Edge-sharing CuO_2 Chains in Ca_2Y_2Cu_5O_(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Study of Temperature Dependent Local Structure by Polarized Cu K-edge EXAFS Measurements on La_Sr_xCuO_4 (x = 0.105, 0.13, 0.20)
- Study of Temperature Dependent Local Structure by Polarized Cu K-edge EXAFS Measurements on La_Sr_xCuO_4 (x=0.105, 0.13, 0.20)
- X-Ray Diffraction Study on Single Crystal of La_Ba_CuO_4
- Ability of Fluorinated AOT Analogues for Microemulsion Formation in Carbon Dioxide
- Water in Supercritical CO_2 Microemulsion Formation by Fluorinated Surfactants
- Evidence for Critical Lattice Fluctuations in the High T_c Cuprates
- Bond Length Relaxation in Ultrathin InAs and InP_As_ Layers on InP(001)
- Local Structure of CuInSe_2 Thin Film Studied by EXAFS
- EXAFS Studies on (Cu, In)Se_2
- K-Edge XANES of GaP, InP and GaSb
- Incorporation Process of the As Atom on the InP(001) Surface Studied by Extended X-Ray Absorption Fine Structure
- Ge Epitaxial Overlayers on Si(001) Studied by Surface-Sensitive X-Ray Absorption Fine Structure: Evidence for Strain-Induced Surface Rearrangement
- Heterointerfaces in Strained-Layer Superlattices Studied by Surface-Sensitive XAFS
- Modification of YBa_2Cu_3O_y Thin Films by Exposure to Argon Plasma and Ozone : A Structural Study