スポンサーリンク
Naka Division, Hitachi High-Technologies Corporation | 論文
- Monte Carlo simulation of topographic contrast in scanning ion microscope
- A method for multidirectional TEM observation of a specific site at atomic resolution
- Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10kV and 40kV
- Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell
- Improvements in performance of focused ion beam cross-sectioning : aspects of ion-sample interaction
- A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy
- Contrast-to-gradient method for the evaluation of image resolution taking account of random noise in scanning electron microscopy
- Simulation study on image contrast and spatial resolution in helium ion microscope
- Contrast-to-gradient method for the evaluation of image resolution in scanning electron microscopy
- Origins of material contrast in scanning ion microscope images
- High-Resolution Stress Mapping of 100-nm Devices Measured by Stress TEM