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NTT Basic Research Laboratories | 論文
- Precipitation of Mayenite in 60CaO・35Al_2O_3・5Fe_2O_3 Glass Annealed at Several Temperatures Below and Above the Glass Transition Temperature
- Softening of Cu(1)-Site Vibration Matched with the Onset Temperature of Superconducting YBa_2(Cu_Sn_)_3O_
- Throughput Measurement of a Multilayer-Coated Schwarzschild Objective Using Synchrotron Radiation
- Formation of an X-Ray microbeam Using a Schwarzschild X-Ray Objective
- Measurement of Knife-Edge Responses of a Schwarzschild X-Ray Objective
- Electrical Characterization of InGaP/GaAs Heterointerfaces Grown by Metalorganic Chemical Vapor Deposition
- 25p-YG-4 Internal Magnetic Focusing in an Array of Ballistic Cavities
- Hot Electron Ballistic Transport in Small Four-Terminal n-AlGaAs/InGaAs/GaAs Structures
- Holographic Motion Pictures by Hole-Burning Using Eu^lt3+gt : Y_2SiO_5
- Internal Magnetic Focusing in an Array of Open Quantum Dots
- Discovery of New Photoluminescence Effect Related to Deep Donor Levels in Si-Doped Al_xGa_As and Microstructures
- High-Pressure Synthesis of Superconducting (Ba_Sr_x)_2Cu_O_(CO_3)_(0.35≤x≤0.6, y≈0.1)
- Tunnelling Spectroscopy of the Interface between Sr_2RuO_4 and a Single Ru Micro-Inclusion in Eutectic Crystals
- Tunneling Properties at the Interface between Superconducting Sr_2RuO_4 and a Ru Microinclusion(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Regulated Single Electron to Single Photon Conversion in a Constant-Current-Driven pn Microjunction
- Rectifying Behavior in Laterally Coupled Self-Assembled Quantum Dots with Asymmetric Tunneling Barriers
- Growth of Twinned Epitaxial Layers on Si(111)√ × √-B Studied by Low-Energy Electron Microscopy
- Electromechanical displacement detection with an on-chip high electron mobility transistor amplifier (Special issue: Microprocesses and nanotechnology)
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy
- Nanometer-Scale Current-Voltage Spectra Measurement of Resonant Tunneling Diodes Using Scanning Force Microscopy