Measurement of Knife-Edge Responses of a Schwarzschild X-Ray Objective
スポンサーリンク
概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1993-04-15
著者
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Nath Krishna
Ntt Basic Research Laboratories
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Ohta Y
Nippon Steel Corp. Kanagawa Jpn
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IKETAKI Yoshinori
NTT Advanced Technology Corporation
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Ohta Yoshinori
Basic Research Laboratory Olympus Optical Co. Ltd.
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Iketaki Yoshinori
Presto "light And Material" Japan Science And Technology Agency
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Iketaki Yoshinori
Advanced Technology Research Center Olympus Optical Co. Ltd.
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Nagai K
Olympus Optical Co. Ltd.
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Shibuya Masaaki
Optical Division Nikon Corporation
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IKETAKI Yoshinori
T. Morokuma Research Laboratory, Olympus Optical Co., Ltd.
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HORIKAWA Yoshiaki
T. Morokuma Research Laboratory, Olympus Optical Co., Ltd.
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MOCHIMARU Shouichirou
T. Morokuma Research Laboratory, Olympus Optical Co., Ltd.
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NAGAI Koumei
T. Morokuma Research Laboratory, Olympus Optical Co., Ltd.
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KAMIJOU Haruo
Production Engineering Division, Olympus Optical Co., Ltd.
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SHIBUYA Masaaki
Production Engineering Division, Olympus Optical Co., Ltd.
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Kamijou Haruo
Production Engineering Division Olympus Optical Co. Ltd.
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Shibuya Masaaki
Production Engineering Division Olympus Optical Co. Ltd.
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Horikawa Y
Olympus Optical Co. Ltd.
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Iketaki Y
Presto "light And Material" Japan Science And Technology Agency
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Mochimaru Shouichirou
T. Morokuma Research Laboratory Olympus Optical Co. Ltd.
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- X-RAY MICROSCOPY IMAGING USING PHOTO-EXCITATION TO ORBITS OF BIOLOGICAL MOLECULES
- OPTICAL PROPERTIES OF FULLERENE, NANOTUBE AND CARBON COMPOUNDS IN THE NEAR K-ABSORPTION EDGE
- Throughput Measurement of a Multilayer-Coated Schwarzschild Objective Using Synchrotron Radiation
- Formation of an X-Ray microbeam Using a Schwarzschild X-Ray Objective
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