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Mechanical Engineering Research Laboratory, HITACHI Ltd. | 論文
- Numerical Analysis on Paper Sheet Separation Using the Overlap Separation Mechanism
- 酸性及びアルカリ性水溶液中における窒化ケイ素セラミックスの腐食劣化挙動
- Molecular Dynamics Study of Impurity Effects on Grain Boundary Grooving
- Analysis of Single-Crystalline Iron Tensile Deformation Using Approximation Neglecting Fluctuations and Molecular Dynamics Simulation
- Molecular Dynamics Simulation of Tensile Deformation of Iron Single Crystals Including Thermal Effect
- P-MC-02 Optimizing Servo-Signal Design in a Hard-Disk Drive
- InGaAsP/InP Laser Diodes Mounted on Semi-Insulating SiC Ceramics : B-2: LD AND LED-1
- Marked Change in Subcavitation-Cascade Performance Resulting from a Very Slight Modification in Leading Edges
- Impact Strength of Steel Plates Struck by Projectiles : Effect of Mechanical Properties on Critical Fracture Energy
- DVM-10 NUMERICAL SIMULATION OF PARTICLE BEHAVIOR IN HARD DISK DRIVES(Drive Mechanisms III,Technical Program of Oral Presentations)
- A Rule-Based Computational Study on the Early Progression of Intracranial Aneurysms Using Fluid-Structure Interaction: Comparison between Straight Model and Curved Model
- Road Map of Micro-Engineering and Nano-Engineering from Manufacturing and Mechanical Engineering Viewpoints(Micro Mechanical Engineering)
- 小型電子計算機によるX線応力測定の自動化
- Evaluation of Charge Passed through Gate-Oxide Films Using a Charging Damage Measurement Electrode
- Slant Slot Antenna-Type Electron Cyclotron Resonance Plasma Source
- ATOMIC-SCALE ANALYSIS OF MICROCHEMICAL CHANGES IN A NI-BASED SUPERALLOY SINGLE CRYSTAL DURING CREEP
- HDI-02 AIR BEARING DESIGN SUPPRESSING REVERSE FLOW FROM THE TRAILING EDGE OF THE SLIDER(Head/Disk Interface and Tribology I,Technical Program of Oral Presentations)
- Measurement of a Three-Dimensional Distribution of Microwave Electric Field in Electron Cyclotron Resonance Plasmas
- Thermal Characteristics of Si Mask for EB Cell Projection Lithography
- Control of Aperture Size of Optical Probes for Scanning Near-Field OpticalMicroscopy Using Focused Ion Beam Technology