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Institute Of Electron Technology | 論文
- Mesoscopic Phenomena in Microstructures of IV-VI Epilayers
- Doping-Induced Contrast in the Refractive Index for GaInN/GaN Structures at Telecommunication Wavelengths
- TEM Characterisation of Silicide Phase Formation in Ni-Based Ohmic Contacts to 4H n-SiC
- Transmission electron microscopy analysis of FeAs precipitates formed in GaAs/AlGaAs heterostructures
- PREFACE
- Electron Microscopy Studies of Non-Local Effects' Impact on Cathodoluminescence of Semiconductor Laser Structures
- Layer or Strip Resistance Measurement by Electron Beam Induced Current Technique in a Scanning Electron Microscope