Transmission electron microscopy analysis of FeAs precipitates formed in GaAs/AlGaAs heterostructures

スポンサーリンク

概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 1998-12-01

著者

• Jin-phillipp N.

  Max-planck Institute Fur Metallforschung

• KATCKI J.

  Institute of Electron Technology

• SHIOJIRI M.

  Kyoto Institute of Technology

• ISSHIKI T.

  Kyoto Institute of Technology

• NIHSIO K.

  Kyoto Institute of Technology

• YABUUCHI Y.

  Matsushita Technoresearch Inc

• Shiojiri M

  Kyoto Inst. Technol. Kyoto Jpn

• Yabuuchi Y

  Characterization Technol. Group Osaka Jpn

関連論文

• Transmission electron microscopy analysis of FeAs precipitates formed in GaAs/AlGaAs heterostructures
• Electron Microscopy Studies of Non-Local Effects' Impact on Cathodoluminescence of Semiconductor Laser Structures
• Electron microscopy analysis of the boundary layer structure of SrTiO_3 semiconducting ceramic
• 24aWJ-4 ATOMIC-RESOLUTION STRUCTUREL AND CHEMICAL ANALYSIS OF MULTIPLE QUANTUM WELLS InGaN/GaN

スポンサーリンク