Electron microscopy analysis of the boundary layer structure of SrTiO_3 semiconducting ceramic

スポンサーリンク

概要

• 論文の詳細を見る
• Published for the Japanese Society of Electron Microscopy by Oxford University Pressの論文
• 2000-02-01

著者

• SHIOJIRI M.

  Kyoto Institute of Technology

• KAWASAKI M.

  Electron Optics Division, JEOL Ltd

• YOSHIOKA T.

  EO Applications Department, JEOL High-Tech Co Ltd

• SATO S.

  Materials Research Center, TDK Co.

• NOMURA T.

  Materials Research Center, TDK Co.

関連論文

• Transmission electron microscopy analysis of FeAs precipitates formed in GaAs/AlGaAs heterostructures
• Electron microscopy analysis of the boundary layer structure of SrTiO_3 semiconducting ceramic
• 24aWJ-4 ATOMIC-RESOLUTION STRUCTUREL AND CHEMICAL ANALYSIS OF MULTIPLE QUANTUM WELLS InGaN/GaN

スポンサーリンク