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Hitachi High Technologies Corp. | 論文
- TEM Observation of Micrometer-Sized Ni Powder Particles Thinned by FIB Cutting Technique
- TEM Observation of Mechanically Alloyed Powder Particles (MAPP) of Mg-Zn Alloy Thinned by the FIB Cutting Technique
- Development of a technique for high resolution electron microscopic observation of nano-materials at elevated temperatures
- Development of a specimen heating holder with an evaporator and gas injector and its application for catalyst
- Development of a gas injection/specimen heating holder for use with transmission electron microscope
- In situ high temperature TEM observation of interaction between multi-walled carbon nanotube and in situ deposited gold nano-particles
- A method for multidirectional TEM observation of a specific site at atomic resolution
- In Situ Study of Chemical Reaction between Silicon and Graphite at 1,400℃ in a High Resolution/Analytical Electron Microscope
- Multidirectional observation of an embedded quantum dot
- Direct Observation of Field Emission Sites in a Single Multiwalled Carbon Nanotube by Lorenz Microscopy
- Evaluation of TEM samples of an Mg-Al alloy prepared using FIB milling at the operating voltages of 10kV and 40kV
- A method for characterizing carbon nanotubes
- Application of a FIB-STEM system for 3D observation of a resin-embedded yeast cell
- Improvements in performance of focused ion beam cross-sectioning : aspects of ion-sample interaction
- Electron Microscopic Observation of the Reduction Process of Indium Oxide to Indium Metal and on the Formation of a Palladium-Indium Intermetallic Compound in a Thermal Pretreatment Process in Graphite-Furnace Atomic Absorption Spectrometry
- Observation of Vaporization in Palladium-Indium Intermetallic Compounds by Graphite Furnace Atomic Absorption Spectrometry Using Transmission Electron Microscopy
- Boron Observation in p-Type Silicon Device by Spherical Aberration Corrected Scanning Transmission Electron Microscope
- Direct Observation of Field Emission Sites in a Single Multiwalled Carbon Nanotube by Lorenz Microscopy