Direct Observation of Field Emission Sites in a Single Multiwalled Carbon Nanotube by Lorenz Microscopy
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概要
- 論文の詳細を見る
Emission sites were observed as bright spots near the tip end of a multiwalled carbon nanotube (MWNT) by means of Lorenz microscopy. The bright spots appeared above electric fields as electrons were emitted. A marked fluctuation was observed in the emission current above 20–30 μA, which was closely related to structural changes at the tip of the MWNT. The layers of the MWNT were peeled off during field emission and they functioned as the second emission sites for the concentration of electric field.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-04-15
著者
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KAMINO Takeo
Hitachi High Technologies Corp.
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Abe Hidekazu
National Institute Of Advanced Science And Technology
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TOKUMOTO Hiroshi
National Institute for Advanced Interdisciplinary Research
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Shimizu Tetuo
National Institute Of Advanced Science And Technology
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HAYASHIBARA Mituo
Materials Research Laboratory, Hitachi, Ltd.
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Ose Yoichi
Hitachi High-technologies Ltd.
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Hidaka Kishio
Materials Research Laboratory Hitachi Ltd.
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Fujieda Tadashi
Materials Research Laboratory Hitachi Ltd.
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Tokumoto Hiroshi
National Institute of Advanced Science and Technology, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Fujieda Tadashi
Materials Research Laboratory, Hitachi, Ltd., 7-1-1 Omika-cho, Hitachi, Ibaraki 319-1292, Japan
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Kamino Takeo
Hitachi Science Systems, Ltd., 11-1 Ishikawa-cho, Hitachinaka, Ibaraki 312-0057, Japan
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Abe Hidekazu
National Institute of Advanced Science and Technology, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Shimizu Tetuo
National Institute of Advanced Science and Technology, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8562, Japan
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Ose Yoichi
Hitachi High-Technologies, Ltd., 882 Ichige, Hitachinaka, Ibaraki 312-8504, Japan
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