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Fujitsu Laboratory Ltd. | 論文
- Current Injection Effects in a Nb/AlO_x-Al/Nb/n-InSb Triode
- A 9-bit 100-MS/s 1.46-mW Tri-Level SAR ADC in 65nm CMOS
- A Dynamic Offset Control Technique for Comparator Design in Scaled CMOS Technology
- Suppression of the Phase Transition to C54 TiSi_2 due to Epitaxial Growth of C49 TiSi_2 on Si(001) Substrates in Silicidation Process
- Grazing Incidence X-Ray Diffraction Study on Effect of Implanted BF^+_2 and Linewidth on Titanium Silicidation
- A 60-GHz Injection-Locked Frequency Divider Using Multi-Order LC Oscillator Topology for Wide Locking Range
- A 9-bit 100MS/s SAR ADC with Digitally Assisted Background Calibration