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Department of Electronic Engineering, the Chinese University of Hong Kong | 論文
- Atomic Force Microscope Studies on Domain Dynamics in Phosphate Substituted Triglycine Sulfate Single Crystals: Evidence for the Domain Boundary Motion towards Negative Region and Holes Formation at the Domain Boundary
- Surface Morphology of Ferroelectric Domains in BaTiO_3 Single Crystals : An Atomic Force Microscope Study
- Domain Structure Investigations of Triglycine Sulfo-Phosphate Single Crystal:Evidence of Domain Motion with Time at Room Temperature
- Silicon Photonics Research in Hong Kong : Microresonator Devices and Optical Nonlinearities
- Measuring the thickness and thickness uniformity of ultra-thin AlOx films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy (マルチメディアストレージ 第6回アジア情報記録技術シンポジウム〔英文〕)
- Measuring the thickness and thickness uniformity of ultra-thin AlO_x films in magnetic tunneling junctions by combined RBS and conducting atomic force microscopy
- Energy-filtered electron diffraction and high-resolution electron microscopy on short-range ordered structure in GaAs_Sb_
- Dielectric Behaviour and Polarization Response of Proton Irradiated Ba_Sr_TiO_3/P(VDF-TrFE) Composites
- Atomic Arrangement in a Triple-period A-type Ordered GaInP Layer Grown with Sb Addition during Metal Organic Vapor Phase Epitaxy Observed by Cross Sectional Scanning Tunneling Microscope
- An Asynchronous Cell Library for Self-Timed System Designs (Special Issue on Asynchronous Circuit and System Design)
- Switching-Wavelength Pulsed Source and Its Applications in Parallel Processing of High-Speed Signals(Evolution of Microwave and Millimeter-Wave Photonics Technology)
- Effects of Annealing on Proton-Exchanged LiNbO_3 Waveguides Fabricated Using Octanoic Acid
- On Four Suboptimal Quadratic Detectors for Random Signals(Fundamental Theories for Communications)
- Preparation of (100)-Oriented LaNiO_3 Oxide Electrodes for SrBi_2Ta_2O_9-Based Ferroelectric Capacitors
- Tip Effects of Piezoelectric-Mode Atomic Force Microscope for Local Piezoelectric Measurements of an SrBi_2Ta_2O_9 Thin Film