スポンサーリンク
Department of Applied Physics University of Tokyo | 論文
- Fast and Slow Processes in Light-Induced Electron Spin Resonance in Hydrogenated Amorphous Si-N Films
- 25pPSA-50 Electronic structures of Ni_2Mn_Sn_ upon the martensitic phase transition studied by X-ray magnetic circular dichroism (XMCD)
- 25aRA-4 Electronic and magnetic structures of Heusler-type alloys Ru_Fe_xCrGe
- 25aRA-3 Electronic structures of Ni_2MnGa upon the martensitic phase transition studied by X-ray magnetic circular dichroism (XMCD)
- Far-Infrared Magneto-Reflection Study of the Band Warping in HgTe
- Preparation of Non-Stoichiometric Nd_MnO_ by Coprecipitation Method
- Electronic Structure of Ni Intercalated TiS_2 Probed by Angle Resolved and 2p Core Resonance Photoemission as Well as by 2p Core Absorption Spectroscopy
- Proton Nuclear Magnetic Resonance Studies on Structural Changes Induced by Annealing of Hydrogenated Amorphous Silicon Films Prepared at High Deposition-Rate
- Design Methodology for La_2O_3-Based Ternally Higher-κ Dielectrics
- A New Hf-based Dielectric Member, HfLaOx, for Amorphous High-k Gate Insulators in Advanced CMOS
- Generalized Model of Oxidation Mechanism at HfO_2/Si Interface with Post-Deposition Annealing
- Dielectric Constant Increase of Yttrium-Doped HfO_2 by Structural Phase Modification
- Far Infrared Study of Structural Distortion and Transformation of HfO_2 by Introducing a Slight Amount of Si
- Stable Observation of the Evolution of Leakage Spots in HfO_2/SiO_2 stacked structures by UHV-C-AFM
- Difference between O_2 and N_2 Annealing Effects on CVD-SiO_2 Film Quality Studied by the Time-Dependent OCP Measurement
- Advantages of Ge (111) Surface for High Quality HfO_2/Ge Interface
- New Method for Characterizing Dielectric Properties of High-k Films with Time-Dependent Open-Circuit Potential Measurement
- Low Dimensionality Observed by ESR Measurements in S = 1 Spin Ladder Substance BIP-TENO (3,3',5,5'-tetrakis(N-tert-butylaminoxyl)biphenyl)(Condensed Matter : Electronic Strucuture, Electrical, Magnetic and Optical Properties)
- 18pZA-6 Soft and Hard X-ray Photoemission in Layered manganite La_Sr_Mn_2O_7
- 27aRF-10 k_z Dependence of Band Dispersion Probed by Soft X-ray Angle Resolved Photoemission in Layered La_Sr_Mn_2O_7