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Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive | 論文

• Correlation between Charge Pumping Method and Direct-Current Current Voltage Methodin p-Type Metal-Oxide-Semiconductor Field-Effect Transistors
• Stress-Induced Leakage Current and Lateral Non-Uniform Charge Generation In Thermal Oxides Subjected to Negative-Gate-Voltage Impulse Stressing
• Stress-Induced Leakage Current and Lateral Nonuniform Charge Generation in Thermal Oxides Subjected to Negative-Gate-Voltage Impulse Stressing
• Post-stress Dual-trap Interaction in Hot-carrier Stressed Submicrometer N-channel Metal-Oxide-Semiconductor Field-Effect-Transistors
• Neutral Electron Trap Generation and Hole Trapping in Thin Oxides under Electrostatic Discharge Stress
• Latent Damage Generation in Submicrometer MOS Devices Under High-Field Impulse Stressing and Its Characterization Using Flicker Noise Measurement

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