Stress-Induced Leakage Current and Lateral Non-Uniform Charge Generation In Thermal Oxides Subjected to Negative-Gate-Voltage Impulse Stressing

スポンサーリンク

概要

論文の詳細を見る
1998-09-07

著者

Lim Peng-soon
Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive
CHIM Wai-Kin
Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering National Univ
Chim Wai-kin
Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive

関連論文

Stress-Induced Leakage Current and Lateral Non-Uniform Charge Generation In Thermal Oxides Subjected to Negative-Gate-Voltage Impulse Stressing

スポンサーリンク