CHIM Wai-Kin | Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering National Univ

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概要

関連著者

Lim Peng-soon
Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive
CHIM Wai-Kin
Centre for Integrated Circuit Failure Analysis and Reliability, Faculty of Engineering National Univ
Chim Wai-kin
Centre For Integrated Circuit Failure Analysis And Reliability Faculty Of Engineering National Unive

著作論文

Stress-Induced Leakage Current and Lateral Non-Uniform Charge Generation In Thermal Oxides Subjected to Negative-Gate-Voltage Impulse Stressing

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