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Central Research Lab., Hitachi, Ltd. | 論文
- Tunneling Acoustic Microscope
- InAlAs/InGaAs HEMTs with Uniform Threshold Voltage Fabricated by Selective Wet-Etching Using Adipic Acid
- Highly Selective Wet-Etching Using Adipic Acid for Uniform Damage-Free Process of InAlAs/InGaAs HEMTs
- Very-Low-Current and High-Speed Switching Operation of InAlGaAs/InAlAs/InP Mach-Zehnder Interferometer-Type Photonic Switch
- Cu Film Growth on a Si(111) Surface Studied by Scanning Tunneling Microscopy
- Initial Stage of Oxygen Adsorption onto a Si(111)-7×7 Surface Studied by Scanning Tunneling Microscopy
- In Situ Observation of Gold Adsorption onto Si(111)7×7 Surface by Scanning Tunneling Microscopy
- InGaP/GaAs Sub-Square-Micron Emitter HBT with f_>100 GHz
- InGaP/GaAs Sub-Square-Micron Emitter HBT with f_>100GHz
- Applying a Mode Selector to Improve the Pulse-Compression Performance of Asymmetric-Coupled-Waveguide-Based Dispersion Compensators
- A New Method for Measurement of Micro-Defects near the Surface of Si Wafers : Optical Shallow Defect Analyzer (OSDA)
- A Low-Power Write Driver for Hard Disk Drives(Novel Device Architectures and System Integration Technologies)
- A new FIB fabrication method for micropillar specimens for three-dimensional observation using scanning transmission electron microscopy
- 垂直磁気記録における磁化反転幅, NLTSの解析モデル