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Center For Integrated Systems Stanford University | 論文
- A 700-MHz Switched-Capacitor Analog Waveform Sampling Circuit (Special Section on the 1993 VLSI Circuits Symposium (Joint Issue with the IEEE Journal of Solid-State Circuits, Vol.29, No.4 April 1994))
- Analysis of Distortion Behavior Considering Polydepletion Effect in MOS Transistors
- Atomic-Scale and Hierarchical Modeling for Nano-Electronics
- Large Signal Analysis of RF Circuits in Device Simulation (Special Issue on TCAD for Semiconductor Industries)
- Excess Noise in Sub-Micron Silicon FET : Transport Theory and Device Optimization
- Experimental Results and Modeling Techniques for Substrate Noise in Mixed-Signal Integrated Circuits (Special Section on the 1992 VLSI Circuits Symposium)
- Mechanism of Surface Charging Effects on Etching Profile Defects
- Direct Measurement of Surface Charging during Plasma Etching ( Plasma Processing)
- Silicon-based Devices and Technology for the Nanoscale Era
- TCAD-Yesterday, Today and Tomorrow (Special Issue on TCAD for Semiconductor Industries)