Atomic-Scale and Hierarchical Modeling for Nano-Electronics

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概要

• 論文の詳細を見る
• 1996-08-26

著者

• Dutton Robert

  Center For Integrated Systems Stanford University

• Onga Shinji

  Ulsi Research Center Toshiba

• KAN Edwin

  Center for Integrated Systems, Stanford University

• OKADA Takako

  ULSI Research Center, Toshiba

• Kan Edwin

  Center For Integrated Systems Stanford University

• Okada Takako

  Ulsi Research Center Toshiba

関連論文

• Analysis of Distortion Behavior Considering Polydepletion Effect in MOS Transistors
• Atomic-Scale and Hierarchical Modeling for Nano-Electronics
• Large Signal Analysis of RF Circuits in Device Simulation (Special Issue on TCAD for Semiconductor Industries)
• TCAD-Yesterday, Today and Tomorrow (Special Issue on TCAD for Semiconductor Industries)

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