Large Signal Analysis of RF Circuits in Device Simulation (Special Issue on TCAD for Semiconductor Industries)
スポンサーリンク
概要
- 論文の詳細を見る
As wireless communication is penetrating every corner of the globe, the optimum design and accurate analysis of RF, power semiconductor devices become one of the biggest challenges in EDA and TCAD (Technology CAD) tool development. The performance gauge for these devices is quite different from that for either digital or analog devices aimed at small-signal applications in that the power gain, efficiency, and distortion (or the range of linearity) are the utmost design concerns. In this article, the methodology and mathematical foundation for numerical analysis of large signal distortion at the device simulation level are discussed. Although the harmonic balance (HB) method has long been used in circuit simulation for large signal distortion analysis, the implementation of the same method in device simulation faces daunting challenges, among which are the tremendous computational cost and memory storage management. But the benefits from conducting such a device level simulation are also obvious for the first time, the impact of technology and structural variation of device on large signal performance can directly be assessed. The necessary steps to make the HB analysis feasible in device simulation are outlined and algorithmic improvement to ease the computation/storage burden is discussed. The applications of the device simulator for various RF powerdevices, including GaAs MESFETs and silicon LDMOS (lateral diffusion MOS) are presented, and the insight gained from such an analysis is provided
- 社団法人電子情報通信学会の論文
- 1999-06-25
著者
-
Dutton Robert
Center For Integrated Systems Stanford University
-
Sato-iwanaga Junko
Matsushita Electronics Corp.
-
Yu Zhiping
Center For Integrated Systems Stanford University
-
TROYANOVSKY Boris
EEsof, HP Co.,
-
Troyanovsky Boris
Eesof Hp Co.
関連論文
- Analysis of Distortion Behavior Considering Polydepletion Effect in MOS Transistors
- Atomic-Scale and Hierarchical Modeling for Nano-Electronics
- Large Signal Analysis of RF Circuits in Device Simulation (Special Issue on TCAD for Semiconductor Industries)
- TCAD-Yesterday, Today and Tomorrow (Special Issue on TCAD for Semiconductor Industries)