Analysis of Distortion Behavior Considering Polydepletion Effect in MOS Transistors

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概要

• 論文の詳細を見る
• 1999-09-20

著者

• Dutton Robert

  Center For Integrated Systems Stanford University

• Oh Kwang-hoon

  Center For Integrated Systems Stanford University

• YU Zhiping

  Center for Integrated Systems, Stanford University

• Yu Zhiping

  Center For Integrated Systems Stanford University

関連論文

• Analysis of Distortion Behavior Considering Polydepletion Effect in MOS Transistors
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• Large Signal Analysis of RF Circuits in Device Simulation (Special Issue on TCAD for Semiconductor Industries)
• TCAD-Yesterday, Today and Tomorrow (Special Issue on TCAD for Semiconductor Industries)

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