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CPRC, Department of Ceramic Engineering, Hanyang University | 論文
- Structural Characterization of a Mo/Ru/Si Extreme Ultraviolet (EUV) Reflector by Optical Modeling
- Numerical Investigation of Defect Printability in Extreme Ultraviolet (EUV) Reflector : Ru/Mo/Si Multilayer System
- Molecular Dynamics Simulation at the Early Stage of Thin-Film Deposition : Al or Co on Co(111)
- Atomistic Investigations of $\alpha$-Fe Thin Film Growth on Al (100)
- Ab initio Investigation of the Early Stage of Nano-scale Thin Film Growth: Al and Co Adatoms on Co (111) Surface
- Molecular Dynamics Simulation at the Early Stage of Thin-Film Deposition: Al or Co on Co(111)
- Structural Characterization of a Mo/Ru/Si Extreme Ultraviolet (EUV) Reflector by Optical Modeling
- Numerical Investigation of Defect Printability in Extreme Ultraviolet (EUV) Reflector: Ru/Mo/Si Multilayer System
- Electronic Structure and Magnetic Property of Mn-Incorporated $\beta$-SiC(100)
- Optimization of Low-Energy Electron Beam Proximity Lithography Stencil Mask Structure Factors by Monte Carlo Simulation