Kouda Miyuki | Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan

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概要

関連著者

Ahmet Parhat
Frontier Collaborative Research Center Tokyo Institute Of Technology
Tsutsui Kazuo
Interdisciplinary Graduate School Of Science & Engineering Tokyo Institute Of Technology
Iwai Hiroshi
Frontier Collaborative Research Center Tokyo Institute Of Technology
Natori Kenji
Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan
Hattori Takeo
Frontier Collaborative Research Center, Tokyo Institute of Technology, Yokohama 226-8503, Japan
Nishiyama Akira
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan
Kakushima Kuniyuki
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan
Sugii Nobuyuki
Interdisciplinary Graduate School of Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan
Kouda Miyuki
Frontier Research Center, Tokyo Institute of Technology, Yokohama 226-8502, Japan

著作論文

Rare earth oxide capping effect on La2O3 gate dielectrics for equivalent oxide thickness scaling toward 0.5nm (Special issue: Dielectric thin films for future electron devices: science and technology)

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