TSAI Hao-Yi | Microelectronics Laboratory, Department of Electrical Engineering, National Cheng Kung University
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- Microelectronics Laboratory, Department of Electrical Engineering, National Cheng Kung Universityの論文著者
Microelectronics Laboratory, Department of Electrical Engineering, National Cheng Kung University | 論文
- Influences of Interface Roughness Scattering on Asymmetric and/or Steplike Current-Voltage Characteristics of Resonant Tunneling Diodes
- Two-Dimensional Numerical Simulation of Si Schottky/Two-Dimensional Electron Gas Barrier Diode Using Boundary Element Method
- Observation of Negative Differential Resistance Phenomena in Porous Silicon Superlattice Structures
- High-Performance Double δ-Doped Channel Si Metal Semiconductor Field-Effect Transistors
- Boron Delta-Doped Si- and Ge_Si_-Channel Metal Semiconductor Field-Effect Transistors Grown by Molecular Beam Epitaxy