GAMO Kenji | Research Center for Extreme Materials and Department of Electrical Engineering, Osaka University

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• Gamo Kenjiの詳細を見る
• 同名の論文著者
• Research Center for Extreme Materials and Department of Electrical Engineering, Osaka Universityの論文著者

Research Center for Extreme Materials and Department of Electrical Engineering, Osaka University | 論文

• Enhanced Diffusion and Lattice Location of Indium and Gallium Implanted in Silicon
• The Characteristics of Ion-Beam-Induced Spontaneous Etching of GaAs by Low-Energy Focused Ion Beam Irradiation : Focused Ion Beam Process
• The Characteristics of Ion-Beam-Induced Spontaneous Etching of GaAs by Low-Energy Focused Ion Beam Irradiation
• Low Energy Focused Ion Beam System and Application to Low Damage Microprocess : Etching and Deposition Technology
• Low Energy Focused Ion Beam System and Application to Low Damage Microprocess

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