NAKAYAMA Yoshiko | Advanced Nano-characterization Center, National Institute for Materials Science
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概要
Advanced Nano-characterization Center, National Institute for Materials Science | 論文
- Image Conservation in Inelastically Scattered Electrons in Reflection Electron Microscopy
- Development of a stage-scanning system for high-resolution confocal STEM
- Design features of a new ultra-high vacuum electron microscope with an omega filter
- Deep-Level Optical Spectroscopy Investigation of Band Gap States in AlGaN/GaN Hetero-Interfaces
- Study of Defects and Strains on Cleaved GaAs (110) Surface by Reflection Electron Microscopy