Pan Liyang | Institute of Microelectronics, Tsinghua University, Beijing 100084, China

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• Pan Liyangの詳細を見る
• 同名の論文著者
• Institute of Microelectronics, Tsinghua University, Beijing 100084, Chinaの論文著者

Institute of Microelectronics, Tsinghua University, Beijing 100084, China | 論文

• Investigation on Annealing and Etching Effects for Pt/Bi3.15Nd0.85Ti3O12/Pt Ferroelectric Capacitors
• Low-Voltage and Low-Current Flash Memory Using Source Induced Band-to-Band Tunneling Hot Electron Injection to Perform Programming
• Characteristics of Fatigue Induced by Distribution of Defect Charges in SrBi2Ta2O9 Capacitors
• Synthesis and Thermal Conductivity Measurement of High-Integrity Ultrathin Oxygen-Implanted Buried Oxide Layers
• Molecular Dynamics Models of Several Hundreds of Atoms for Back-End-of-Line Dielectrics

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